- ASTM E722, 2014 Edition, Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
- BS EN 60749-42, 2014 Edition, Semiconductor devices. Mechanical and climatic test methods. Temperature and humidity storage
- BS EN 62047-20, 2014 Edition, Semiconductor devices. Micro-electromechanical devices. Gyroscopes
- BS EN 62047-21, 2014 Edition, Semiconductor devices. Micro-electromechanical devices. Test method for Poisson's ratio of thin film MEMS materials
- IEC 60749-42, Edition 1.0, Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
- IEC 62031 Amendment 2, Amendment 2 for Edition 1.0, Amendment 2 - LED modules for general lighting - Safety specifications
- IEC 62047-20, Edition 1.0, Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
- IEC 62047-21, Edition 1.0, Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
For more standards like these, please see our Document Center List of Standards on Semiconductor Devices. You can also review U.S. military standards on this topic at our List for Semiconductor Standards FSC 5961 and List for Electronic Microcircuits FSC 5962.
Don't forget my previous postings:
